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Characterization of anisotropically shaped silver nanoparticle arrays via spectroscopic ellipsometry supported by numerical optical modeling
Citation key ISI:000408756700031
Author Gkogkou, Dimitra and Shaykhutdinov, Timur and Oates, Thomas W. H. and Gernert, Ulrich and Schreiber, Benjamin and Facsko, Stefan and Hildebrandt, Peter and Weidinger, Inez M. and Esser, Norbert and Hinrichs, Karsten
Pages 460-464
Year 2017
ISSN 0169-4332
DOI 10.1016/j.apsusc.2016.10.105
Journal APPLIED SURFACE SCIENCE
Volume 421
Number B, SI
Month NOV 1
Abstract The present investigation aims to study the optical response of anisotropic Ag nanoparticle arrays deposited on rippled silicon substrates by performing a qualitative comparison between experimental and theoretical results. Spectroscopic ellipsometry was used along with numerical calculations using finite-difference time-domain (FDTD) method and rigorous coupled wave analysis (RCWA) to reveal trends in the optical and geometrical properties of the nanoparticle array. Ellipsometric data show two resonances, in the orthogonal x and y directions, that originate from localized plasmon resonances as demonstrated by the calculated near-fields from FDTD calculations. The far-field calculations by RCWA point to decoupled resonances in x direction and possible coupling effects in y direction, corresponding to the short and long axis of the anisotropic nanoparticles, respectively. (C) 2016 Elsevier B.V. All rights reserved.
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